생산 공정에서 촬영된 정상 반도체 소자 이미지로부터 비정상 샘플을 검출하는 비지도 학습 기반의 이상 탐지 AI 모델 개발
active 2024-03-26 → 2024-03-26 (UTC)
Activity over time
Daily event counts in the loaded window
Line chart, 1 days from 2024-03-26 to 2024-03-26. Pushes: 0 total, peak 0 in a day. Pull requests: 0 total, peak 0 in a day. Issues: 0 total, peak 0 in a day. Comments: 0 total, peak 0 in a day. Stars: 0 total, peak 0 in a day.
- Pushes
- Pull requests
- Issues
- Comments
- Stars
Top contributors
Pushes, PRs, issues, reviews and comments — stars and forks excluded, so this is contribution rather than popularity
Nobody pushed, opened or commented here in the loaded window — this repo's activity is stars and forks only.
Recent activity
Latest issues, pull requests and releases
No issue or PR events — this repo's activity is pushes only.
Totals cover only the window loaded into ClickHouse and count events, not GitHub's lifetime totals — 0 stars here means stars gained during the window, not the repo's star count.